BAI LONG

·Paper Publications

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Ultrasonic defect characterization using Bayesian inversion and scattering matrix denoising neural networks.
Release time:2023-04-24  Hits:

Indexed by: Journal paper

First Author: Changrong Guo

Correspondence Author: Long Bai

Co-author: Junjie Ren,Jianfeng Xu

Journal: NDT&E International

Volume: 136

Page Number: 102813

Date of Publication: 2023-02-10