BAI LONG

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Ultrasonic defect characterization using the scattering matrix: A performance comparison study of Bayesian inversion and machine learning schemas
Release time:2021-10-05  Hits:

Indexed by: Journal paper

First Author: Long Bai

Correspondence Author: Long Bai

Co-author: Florian Le Bourdais,Roberto Miorelli,Pierre Calmon,Alexander Velichko,Bruce W. Drinkwater

Journal: IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Included Journals: SCI

Volume: 68

Issue: 10

Page Number: 3143-3155

Date of Publication: 2021-05-28