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Fundamental aspects of electric double layer force-distance measurements at liquid-solid interfaces using atomic force microscopy
Release time:2019-09-03  Hits:

First Author: Jennifer M. Black

Correspondence Author: Guang Feng*,Nina Balke*

Co-author: Mengyang Zhu, Pengfei Zhang, Raymond R. Unocic, Daqiang Guo, M. Baris Okatan, Sheng Dai, Peter T. Cummings, Sergei V. Kalinin, Guang Feng*

Journal: Scientific Reports

Volume: 6

Page Number: 32389