Indexed by: Journal paper

Document Code: 10.1109/TASC.2011.2182172

First Author: Lantao Huang

Correspondence Author: Xiaotao Han

Journal: IEEE Transactions on Applied Superconductivity

Included Journals: EI、SCI

Affiliation of Author(s): Wuhan National High Magnetic Field Center

Volume: 22

Issue: 3

Page Number: 6400404

ISSN No.: 1051-8223

Key Words: Strain , Integrated circuits , Degradation , Fatigue , Critical current , Nitrogen , Current measure

Date of Publication: 2012-06-01

Abstract: The critical current (IC) of high temperature superconductors is an important parameter for practical application, such as magnets, cables and transformers. The degradation of IC under the tensile strain is measured at 77 K as well as under the compressive strain. It is found that the properties of Bi-2223 tapes are superior in the compressive strain to that in the tensile strain. The fatigue degradation behaviors of Bi-2223 tapes are studied in the symmetrical strain cycles and the unidirectional strain cycles. Both of the tests are conducted at 77 K.