·Paper Publications
(11) Xuefei Li, Xiong Xiong, Tiaoyang Li, Sichao Li, Zhenfeng Zhang, and Yanqing Wu. Effect of dielectric interface on the performance of MoS2 transistors. ACS Applied Materials & Interfaces 2017, 9, 44602-44608.
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(10) Xuefei Li, Tiaoyang Li, Zhenfeng Zhang, Xiong Xiong, Sichao Li, and Yanqing Wu. Tunable low-frequency noise in dual-gate MoS2 transistors. IEEE Electron Device Letters 2018, 39, 131-134.
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(12) Xuefei Li, Yuchen Du, Mengwei Si, Lingming Yang, Sichao Li, Tiaoyang Li, Xiong Xiong, Peide Ye and Yanqing Wu. Mechanisms of current fluctuation in ambipolar black phosphorus field-effect transistors. Nanoscale 2016, 8, 3572-3578.