(7) Xuefei Li, Jingyi Wu, Yunsheng Ye, Shengman Li, Tiaoyang Li, Xiong Xiong, Xiaole Xu, Tingting Gao, Xiaolin Xie, and Yanqing Wu. Performance and reliability improvement under high current densities in black phosphorus transistors by interface engineering. ACS Applied Materials & Interfaces 2019, 11, 1587-1594.
发布时间：2023-04-10
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