·Paper Publications
J. J. Zhang, H. Liu, H. J. Sun*, P. Yan,Y. Li, S. J. Zhong, S. Xie, R. J. Li, and X. S. Miao, Charged defects-induced resistive switching in Sb2Te3memristor, Journal of Electronic Materials, 45(2), 1154-1159 (2016).
Release time:2020-11-30 Hits:
-
Pre One:：
王宁, 周敬利, 陈加忠, 向金海. 自适应尺度的形状表示与匹配方法. 华中科技大学学报自然科学版, 38(6): 71-74, 2010.
-
Next One:：
Hui Feng, Hefei Ling, Fuhao Zou, Zhengding Lu, and Jiazhong Chen. A Performance Evaluation of Collusion Attacks in Multimedia Fingerprinting. The International Conference on Multimedia Information Networking and Security (MINES), IEEE, Vol 1: 530-534, 2009.