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Indexed by:
Journal paper
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Document Code:
258254
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First Author:
Chaotan SIMA
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Co-author:
James C. Gates,Michalis N. Zervas,Peter G.R. Smith
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Journal:
Optics Express
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Included Journals:
SCI、EI
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Volume:
21
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Issue:
13
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Page Number:
15747-15754
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ISSN No.:
1094-4087
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Key Words:
Bragg reflectors, Integrated optics, Gratings, Interferometry, Phase modulation, Apodization.
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DOI number:
10.1364/OE.21.015747
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Date of Publication:
2013-06-24
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Impact Factor:
3.669
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Abstract:
A direct UV grating writing technique based on phase-controlled interferometry is proposed and demonstrated in a silica-on-silicon platform, with a wider wavelength detuning range than any previously reported UV writing technology. Electro-optic phase modulation of one beam in the interferometer is used to manipulate the fringe pattern and thus control the parameters of the Bragg gratings and waveguides. Various grating structures with refractive index apodization, phase shifts and index contrasts of up to 0.8 × 10−3have been demonstrated. The method offers significant time/energy efficiency as well as simplified optical layout and fabrication process. We have shown Bragg gratings can be made from 1200nm to 1900nm exclusively under software control and the maximum peak grating reflectivity only decreases by 3dBover a 250 nm (~32THz) bandwidth.
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Links to published journals:
