Sophia Wu

·Paper Publications

Current position: 英文主页 > Scientific Research > Paper Publications
Xin Shi, Fei Wu*, Shunzhuo Wang, Changsheng Xie, Zhonghai Lu, Program Error Rate-based Wear Leveling for NAND Flash Memory, Design, Automation & Test in Europe Conference & Exhibition, Dresden (DATE 2018), Germany, 2018.3.19-3.23.(CCF B, TOP80)
Release time:2018-10-23  Hits: