·Paper Publications
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Pre One::
Meng Zhang, Fei Wu* , He Huang , Qian Xia , Jian Zhou , Changsheng Xie, FPGA-based failure mode testing and analysis for MLC NAND flash memory, Design, Automation & Test in Europe Conference & Exhibition (DATE 2017), Lausanne, Switzerland, 2017.3.27-3.31(CCF B)
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Next One::
Qin Xiong, Fei Wu*, Zhonghai Lu, Yue Zhu, You Zhou, Yibing Chu, Changsheng Xie, Ping Huang, Characterizing 3D Floating Gate NAND Flash, ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems (Sigmetrics 2017), Urbana-Champaign, USA, 2017.6.5-6.9(CCF B)