Xia Min

·Patents

Current position: 英文主页 > Scientific Research > Patents
一种抑制杂散光的物质折射率测量装置
Release time:2021-04-12  Hits:

Affilication of Author(s): 光学与电子信息学院

School Sign: 华中科技大学

Patent Applicant: 华中科技大学

Disigner of the Invention: Wei Li,Kecheng Yang,Xia Min,郭文平

Type of Patent: 发明专利

Authorization number: 2017103958247

Number of Inventors: 4

Application Date: 2017-05-31

Authorization Date: 2019-11-12

First Author: 郭文平