·Patents
一种折射率分布测量的折光计
Release time:2021-04-12 Hits:
Affilication of Author(s): 光学与电子信息学院
School Sign: 华中科技大学
Patent Applicant: 华中科技大学
Disigner of the Invention: Kecheng Yang,Wei Li,陈俊尧,郭文平,罗运,Xia Min
Type of Patent: 发明专利
Authorization number: 2017101480809
Number of Inventors: 6
Application Date: 2017-03-14
Authorization Date: 2020-05-26
First Author: Xia Min