·Patents
一种基于光电传感阵列测量折射率的亚像素位置获取方法
Release time:2021-04-12 Hits:
Affilication of Author(s): 光学与电子信息学院
School Sign: 华中科技大学
Patent Applicant: 华中科技大学
Disigner of the Invention: Wei Li,Kecheng Yang,郭文平,罗运,Xia Min
Type of Patent: 发明专利
Authorization number: 2018108495689
Number of Inventors: 5
Application Date: 2018-07-28
Authorization Date: 2020-09-02
First Author: Xia Min