·Paper Publications
(2009a) Dan Xie*, Wenkao Yu, Yafeng Luo, Kanhao Xue, Tianling Ren and Litian Liu, Etching behavior and damage rejuvenation of top electrode and Bi3.15Nd0.85Ti3O12 films applied in ferroelectric random access memory devices, Japanese Journal of Applied Physics 48, 050209 (2009).
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(2009b) TianLing Ren*, MingMing Zhang, Ze Jia, LinKai Wang, ChaoGang Wei, KanHao Xue, YingJie Zhang, Hong Hu, Dan Xie and LiTian Liu, Model and key fabrication technologies for FeRAM, ECS Transactions 22, 217 (2009).
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(2008b) Xin-Yi Wen*, Jun Yu, Tian-Ling Ren, Kan-Hao Xue, Wen-Li Zhou and Yun-Bo Wang, Studies on the fatigue behavior of ferroelectric film using Preisach approach, Integrated Ferroelectrics 99, 3 (2008).