华中科技大学主页平台管理系统 ZHANG WEN HAO--英文主页-- Scanning tunneling microscopy study on two-dimensional topological insulators

张文号

Recommended Ph.D.Supervisor Recommended MA Supervisor

·Paper Publications

Current position: 英文主页 > Scientific Research > Paper Publications

Scanning tunneling microscopy study on two-dimensional topological insulators

Release time:2021-03-05 Hits:

First Author: Fu*,Y.-S.,Zhang*,W.-H.,Zhang,Z.-M.

Journal: Acta Physica Sinica 68, 226801 (2019).

Pre One:：
Heterostructures of tellurium on NbSe2 from sub-monolayer to few-layer films
Next One:：
Dimensional crossover and topological phase transition in Dirac semimetal Na3Bi films