常用链接
- [1]Tan, T.; Liu, Z.*; Lu, H.; Liu, W.; Yan, F., Chemical Structure and Electrical Properties of Sputtered HfO2 Films on Si Substrates Annealed by Rapid Thermal Annealing. Vacuum 2009, 83(9), 1155-1158;.
- [2]Tan, T.; Liu, Z.*; Lu, H.; Liu, W.; Yan, F.; Zhang, W., Band Structure and Valence-Band Offset of HfO2 Thin Film on Si Substrate from Photoemission Spectroscopy. Appl. Phys. A 2009, 97(2), 475-479;.
- [3]Shen, X.; Liu, Z.*; Li, Y.; Lu, H.; Preparation and Performance of Broadband Antireflective Sub-Wavelength Structures on Ge Substrate, Optoelectronics Letters 2009, 5(1), 11-13;.