华中科技大学主页平台管理系统 TANG CHAO QING--Home-- AR aided Smart Sensing for In-line Condition Monitoring of IGBT Power Semiconductor Wafer

唐朝清Lecturer (higher education) Doctoral Degree in Philosophy

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AR aided Smart Sensing for In-line Condition Monitoring of IGBT Power Semiconductor Wafer

Release time:2021-02-26Hits:

First Author: K. Li

Correspondence Author: G. Y. Tian

Co-author: X. Chen,C. Tang

Journal: IEEE Transactions on Industrial Electronics

Date of Publication: 2019-02-05

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