·Paper Publications
Meng Zhang, Fei Wu* , He Huang , Qian Xia , Jian Zhou , Changsheng Xie, FPGA-based failure mode testing and analysis for MLC NAND flash memory, Design, Automation & Test in Europe Conference & Exhibition (DATE 2017), Lausanne, Switzerland, 2017.3.27-3.31（CCF B）
Release time:2018-10-23 Hits:
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Pre One:：
Yao Ting, Jiguang Wan*, Ping Huang, Xubin He, Fei Wu*, Changsheng Xie, A Light-weight Compaction Tree to Reduce I/O Amplification toward Efficient Key Value Stores, Proceedings of 33rd International Conference on Massive Storage Systems and Technology (MSST 2017). Santa Clara, CA, USA , 2076.5.2-5.6（CCF B）
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Next One:：
Shunzhuo Wang, Fei Wu*, Zhonghai Lu, You Zhou, Qin Xiong, Meng Zhang, Changsheng Xie, Lifetime adaptive ECC in NAND flash page management, Design, Automation & Test in Europe Conference & Exhibition (DATE 2017), Lausanne, Switzerland, 2017.3.27-3.31（CCF B）