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(2021m) Ying Zhang, Ge-Qi Mao, Xiaolong Zhao*, Yu Li, Meiyun Zhang, Zuheng Wu, Wei Wu, Huajun Sun, Yizhong Guo, Lihua Wang, Xumeng Zhang, Qi Liu, Hangbing Lv, Kan-Hao Xue*, Guangwei Xu, Xiangshui Miao, Shibing Long* and Ming Liu*, Evolution of the conductive filament system in HfO2-based memristors observed by direct atomic-scale imaging, Nature Communications 12, 7232 (2021).