·Paper Publications
(2008b) Xin-Yi Wen*, Jun Yu, Tian-Ling Ren, Kan-Hao Xue, Wen-Li Zhou and Yun-Bo Wang, Studies on the fatigue behavior of ferroelectric film using Preisach approach, Integrated Ferroelectrics 99, 3 (2008).
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(2009a) Dan Xie*, Wenkao Yu, Yafeng Luo, Kanhao Xue, Tianling Ren and Litian Liu, Etching behavior and damage rejuvenation of top electrode and Bi3.15Nd0.85Ti3O12 films applied in ferroelectric random access memory devices, Japanese Journal of Applied Physics 48, 050209 (2009).
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(2008a) Kan-Hao Xue, Tian-Ling Ren*, Dan Xie, Ze Jia, Ming-Ming Zhang and Li-Tian Liu, Nitrogen-rich titanium nitride serving as Pt-Al diffusion barrier for FeRAM application, Integrated Ferroelectrics 96, 19 (2008).