|
Y. He, S. Lin, H. Robert, H. Li, P. Zhang, M. Piliarik, X.-W. Chen, Multiscale Modeling and Analysis for High-fidelity Interferometric Scattering Microscopy
点击次数：
论文类型：期刊论文
发表刊物：Journal of Physics D: Applied Physics
收录刊物：SCI
学科门类：物理学
文献类型：J
卷号：54
页面范围：274002
发表时间：2021-03-01
发布期刊链接：https://iopscience.iop.org/article/10.1088/1361-6463/abf70d
上一条：Z. Tian, P. Zhang, X.-W. Chen, Static hybrid quantum nodes: Toward perfect state transfer on a photonic chip
下一条：W. Li, L. Morales-Inostroza, W. Xu, P. Zhang, J. Renger, S. Götzinger, X.-W. Chen, Truncated Metallo-Dielectric Omnidirectional Reflector: Collecting Single Photons in the Fundamental Gaussian Mode with 95% Efficiency