·Paper Publications
Zheng Ying, Mao Simin, Liu Shujie, Wong David Shan-Hill, Wang Yan-Wei. Normalized relative RBC based minimum risk bayesian decision approach for fault diagnosis of industrial process. IEEE Transactions on Industrial Electronics, 2016, 63(12): 7723-7732.
Release time:2018-03-22 Hits:
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Zheng Ying, Lin Dan, Wang Yanwei, Jang Shi-Shang, Tao Bo. Model quality evaluation in semiconductor manufacturing process with EWMA run-to-run control. IEEE Transactions on Semiconductor Manufacturing, 2017, 30(1): 8-16.
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Chen Zhihua, Zheng Ying, Zhou Minjing, Wong David Shan-Hill, et al. Model-based feedforward register control of roll-to-roll web printing systems. Control Engineering Practice, 2016, 51: 58-68. (Corresponding Author)