·Paper Publications
C. Yang, J. Liu, K. Zhou and X. Jiang, "Semi-supervised machine fault diagnosis fusing unsupervised graph contrastive learning," in IEEE Transactions on Industrial Informatics, 2022, doi: 10.1109/TII.2022.3220847.
Release time:2022-11-15 Hits:
Journal: IEEE TII
DOI number: 10.1109/TII.2022.3220847
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Pre One:：
Mengliang Zhu, Jie Liu, Yanglong Lu, Zhongxu Hu, Li Yuan, Kaibo Zhou, Black-box domain adaptation for cross-domain on-device machinery fault diagnosis via hierarchical debiased self-supervised learning, Knowledge-Based Systems, Volume 324, 2025, 113882, ISSN 0950-7051, https://doi.org/10.1016/j.knosys.2025.113882.
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Next One:：
K. Zhou, C. Yang, J. Liu and Q. Xu, "Dynamic Graph-Based Feature Learning With Few Edges Considering Noisy Samples for Rotating Machinery Fault Diagnosis," in IEEE Transactions on Industrial Electronics, vol. 69, no. 10, pp. 10595-10604, Oct. 2022, doi: 10.1109/TIE.2021.3121748.