Validation of van der Waals Interface for Enhanced Resistive Switching Performance in Memristor by Using Topotactic Phase Transition Material
Release time:2024-09-24
Hits:
- Indexed by:
- Journal paper
- First Author:
- Rui Su,Yuheng Deng,Weichao Jiang
- Correspondence Author:
- Weiming Cheng,Jingping Xu,Peter To Lai
- Co-author:
- Yufeng Duan,Runqing Zhang,Ruizi Xiao,Chenglin Shen,Mingxing Gong,Xiangshui Miao
- Journal:
- ACS Applied Electronic Materials
- Included Journals:
- SCI
- Affiliation of Author(s):
- 华中科技大学
- Discipline:
- Engineering
- First-Level Discipline:
- 电子科学技术
- Document Type:
- J
- Volume:
- 6
- Issue:
- 9
- Page Number:
- 6338-6343
- Date of Publication:
- 2024-09-24
Attachments:
- Pre One:Oxygen Vacancy Compensation-Induced Analog Resistive Switching in the SrFeO3−δ/Nb:SrTiO3 Epitaxial Heterojunction for NoiseTolerant High-Precision Image Recognition
- Next One:Improved cycling stability and ON-OFF ratio of SrFeOx topological phase transition memristors using a La0.7Sr0.3MnO3 bottom electrode