华中科技大学主页平台管理系统 Xue Kanhao--英文主页--Paper Publications

Xue Kanhao

Recommended Ph.D.Supervisor Recommended MA Supervisor

·Paper Publications

Current position: 英文主页 > Scientific Research > Paper Publications

[91] (2011c) Christopher R. McWilliams*, Jolanta Celinska, Carlos A. Paz de Araujo and Kan-Hao Xue, Device characterization of correlated electron random access memories, Journal of Applied Physics 109, 091608 (2011)..
[92] (2011b) Jolanta Celinska*, Christopher McWilliams, Carlos Paz de Araujo and Kan-Hao Xue, Material and process optimization of correlated electron random access memories (CeRAMs), Journal of Applied Physics 109, 091603 (2011)..
[93] (2011a) Kan-Hao Xue*, Carlos A. Paz de Araujo, Jolanta Celinska and Christopher McWilliams, A non-filamentary model for unipolar switching transition metal oxide resistance random access memories, Journal of Applied Physics 109, 091602 (2011)..
[94] (2010) Kan-Hao Xue*, Carlos A. Paz de Araujo and Jolanta Celinska, A comparative study on Bi4Ti3O12 and Bi3.25La0.75Ti3O12 ferroelectric thin films derived by metal organic decomposition, Journal of Applied Physics 107, 104123 (2010)..
[95] (2009c) Kan-Hao Xue*, Jolanta Celinska and Carlos A. Paz de Araujo, Low temperature preparation of ferroelectric bismuth titanate thin films, Applied Physics Letters 95, 052908 (2009)..
[96] (2009b) TianLing Ren*, MingMing Zhang, Ze Jia, LinKai Wang, ChaoGang Wei, KanHao Xue, YingJie Zhang, Hong Hu, Dan Xie and LiTian Liu, Model and key fabrication technologies for FeRAM, ECS Transactions 22, 217 (2009)..
[97] (2009a) Dan Xie*, Wenkao Yu, Yafeng Luo, Kanhao Xue, Tianling Ren and Litian Liu, Etching behavior and damage rejuvenation of top electrode and Bi3.15Nd0.85Ti3O12 films applied in ferroelectric random access memory devices, Japanese Journal of Applied Physics 48, 050209 (2009)..
[98] (2008b) Xin-Yi Wen*, Jun Yu, Tian-Ling Ren, Kan-Hao Xue, Wen-Li Zhou and Yun-Bo Wang, Studies on the fatigue behavior of ferroelectric film using Preisach approach, Integrated Ferroelectrics 99, 3 (2008)..
[99] (2008a) Kan-Hao Xue, Tian-Ling Ren*, Dan Xie, Ze Jia, Ming-Ming Zhang and Li-Tian Liu, Nitrogen-rich titanium nitride serving as Pt-Al diffusion barrier for FeRAM application, Integrated Ferroelectrics 96, 19 (2008)..
[100] (2007) Kan-Hao Xue, Tian-Ling Ren*, Tian-Zhi Liu, Dan Xie, Ze Jia and Li-Tian Liu, Investigation on annealing and etching effects for Pt/Bi3.15Nd0.85Ti3O12/Pt ferroelectric capacitors, Japanese Journal of Applied Physics 46, 4200 (2007)..

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