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Paper Publications

Title : A Novel Variation-aware Error Monitoring Scheme for Memristor-based Material Implication Logic

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Author : J. Xu, Y. Zhan, Z. Wang, G. Yu, Y. Li, and C. Wang

Journal : IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA 2020)

Included Journals : EI  

Document Type : C

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