研究员（自然科学）
Supervisor of Doctorate Candidates
Supervisor of Master's Candidates
Gender:Male
Status:Employed
Department:School of Optical and Electronic Information
Education Level:Postgraduate (Doctoral)
Degree:Doctoral Degree in Engineering
Discipline:Microelectronics and Solid-state Electronics
Electrical Circuit and System
A Novel Variation-aware Error Monitoring Scheme for Memristor-based Material Implication Logic
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Co-author:J. Xu, Y. Zhan, Z. Wang, G. Yu, Y. Li,C. Wang
Journal:IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA 2020)
Included Journals:EI
Document Type:C
DOI number:10.1109/ICTA50426.2020.9332122
Abstract:This paper proposes a novel error monitoring scheme for memristor-based Material Implication (IMP) logic. The novel monitoring method utilizes differences in the voltage of source-line (VsL) under different input cases after IMP operation, to detect two major types operation failures caused by gradual degradation phenomenon of memristor's positive threshold voltage (Vclοse). Simulation results under PVT variation show that the proposed error monitoring circuit in 0.18 μm technology can perform successful failure detection within two operation cycles, which can be used for periodic memristors failure detection and adaptively adjusting operation voltages during memristive IMP operation.
Links to published journals:https://ieeexplore.ieee.org/document/9332122
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