·Paper Publications
Zhang Wenfeng#, *, Lou Xun, Xie Zijian, Chang Haixin, Band bending analysis of charge characteristics at GeO2/Ge interface by x-ray photoemission spectroscopy, J. Phys. D: Appl. Phys., 2019.1.23, 52(4): 045101
Release time:2021-07-01 Hits:
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Pre One:：
Wenfeng Zhang#, *, Tomonori Nishimura, and Akira Toriumi, Impact of GeO2 passivation layer quality on band alignment at GeO2/Ge interface studied by internal photoemission spectroscopy, Appl. Phys. Express, 2016, 9: 024201
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Yoshikazu Ito#, Wenfeng Zhang#, Jinhua Li, Haixin Chang*, Pan Liu, Takeshi Fujita, Yongwen Tan, Feng Yan and Mingwei Chen*, 3D Bicontinuous Nanoporous Reduced Graphene Oxide for Highly Sensitive Photodetectors, Adv. Funct. Mater., 2016, 26(8): 1271-1277