[Invited Paper] Challenges and Trends of Memristive IMPLY-based In-memory Computing: Efficiency, Reliability, and Compatibility Perspectives

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First Author:Jiarui Xu

Correspondence Author:Chao Wang

Co-author:Boyi Dong, Mengjie Li, Yuansheng Zhao, Yuanjin Zheng and

Journal:IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA 2023)

Included Journals:EI

Discipline:Engineering

First-Level Discipline:Electronic Science And Technology

Document Type:C

DOI number:10.1109/ICTA60488.2023.10364303

Date of Publication:2023-09-06

Abstract:Memristive In-Memory Computing (IMC) through Material Implication logic (IMPLY) has emerged as a promising solution for intelligent edge devices. However, three major issues including computational efficiency, system reliability, and memristor array compatibility hinder the actual applications of the IMPLY-based IMC technology. In this paper, we investigate the effective solutions from system, architecture and circuit levels from the literature. Key metrics benchmark with a general Figure of Merit (FoM) including the number of memristors, operational steps, and switches are considered. Furthermore, some emerging trends of IMPLY-based IMC research are also discussed. The goal is to provide a broad perspective and a deep insight for the future research of memristive IMPLY-based IMC technology.

Links to published journals:https://ieeexplore.ieee.org/document/10364303