·Patents
一种双线阵结构光三维测量系统及其测量方法
Release time:2025-03-26 Hits:
Application Number: CN201911042096.7
Authorization number: CN110686598B
Application Date: 2019-10-30
Publication Date: 2020-01-14
Authorization Date: 2021-04-20
Application Number: CN201911042096.7
Authorization number: CN110686598B
Application Date: 2019-10-30
Publication Date: 2020-01-14
Authorization Date: 2021-04-20